X-ray two-beam topography for quantitative derivation of phase shift by crystalline dislocations

Abstract

Quantitative evaluation of crystalline dislocations is gaining importance in order to realize functional materials with ultimate performance. X-ray topography has been an important tool to evaluate the crystalline dislocations in bulk in a large volume, but the research up to now lacks the analysis to derive the phase at the image plane and such a situation prevents us from obtaining knowledge of lattice planes around the crystalline dislocations. Here we report a method that enables us to obtain such knowledge in a crystal using an x-ray two-beam topography at the kinematical diffraction regime. It can quantitatively derive the phase shift by the Bragg reflection around the crystalline dislocations. We observed an x-ray vortex wave field from a silicon carbide crystal containing a screw dislocation which almost perfectly agrees with simulations. This method will clarify the distribution and network of the threading screw dislocations and other dislocations in a large field of view.Received 17 June 2022Revised 15 October 2022Accepted 4 January 2023DOI:https://doi.org/10.1103/PhysRevResearch.5.L012043Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.Published by the American Physical SocietyPhysics Subject Headings (PhySH)Research AreasAngular momentum of lightAtomic & molecular structureX-ray beams & opticsPhysical SystemsCrystal structuresFunctional materialsTechniquesX-ray imagingAtomic, Molecular & OpticalCondensed Matter, Materials & Applied Physics