Abstract
AbstractX‐ray diffraction studies of phase transitions in (NH4)2SbF3 single crystals have been made by using the Bond‐type diffractometer for high‐precision measurements of the unit‐cell dimensions in a function of temperature. The principal linear thermal expansion coefficients and the linear Eulerian strain tensor have been calculated in the temperature interval 110 – 298 K. The phase transition diagram was proposed and the sequence of the phases has been compared with the results of other experimental techniques (NMR, NQR, DTA, electrophysical methods).
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