Abstract
It has been generally accepted that X-ray stress measurement of very coarse polycrystalline materials is difficult because of their spotty X-ray diffraction patterns.In this paper, we propose to discuss the θ-2θ and the fixed specimen method, and verify experimentally which method is more profitable for measuring stress of the specimen with very coarse grain.The results obtained are as follows:(1) The fixed specimen method is inadequate for coarse polycrystalline materials.(2) By the θ-2θ method it is ultimately possible to measure accurately the stresses on materials having such a large average grain size as 200μ.(3) The experimentally obtained X-ray elastic constants E/(I+ν) are almost invariable for materials having average grain size from 5μ to 120μ.
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