Abstract

Ag-doped phosphate glass (Ag-PG) is an excellent X-ray image storage material applied for recording X-ray tracks. In this work, we used Geant4 software to simulate the energy deposition attenuation and 2D/3D storage tracks characteristics of Ag-PG. The influence of the secondary particles generated by the interaction between X-rays and Ag-PG was analyzed. The storage cutoff depth of Ag-PG was verified at the Shanghai Synchrotron Radiation Facility (SSRF). The results show that the optical transmittance is slightly decreased after X-ray irradiation. The cutoff depth is only 200 μm for complete absorption, when the X-ray energy is 5 keV. The deposited energy is attenuated by 19.8% at the depth of 900 μm, when the X-ray energy is 30 keV. The distribution of deposited energy is primarily influenced by the attenuation of secondary electrons generated by the interaction between X-rays and Ag-PG. Furthermore, the 2D/3D models show that the storage depth is not significantly affected by different doses at the same X-ray energy. The low diffusion of the tracks spread plays a crucial role in achieving high spatial resolution. The storage cutoff depth in Ag-PG is approximately 10 mm at 20 keV. This has been successfully verified by SSRF, and it holds great significance for high-resolution imaging and quantitative storage of X-ray images in Ag-PG.

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