Abstract
Measurements with standing X-ray wave-fields were carried out for the first time under UHV conditions. Difficulties which were predicted for such measurements before were solved by using synchrotron X-radiation. The (111) Fourier component of the distribution function of 1 ML Br on a Si(111)−(1×1) surface was determined and reveals a Br position of 0.64 · d 111 perpendicular to the (111) planes, which favours a three-fold ionic adsorption site. This adsorbate geometry differs markedly from the Br on-top position on a chemically prepared surface.
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