Abstract
We applied the X-ray standing-wave technique to study the lattice location of rare-earth atoms in thin films of RBa 2Cu 3O 7− δ (R=Gd, Pr). The films had a thickness of 200 nm and were grown by pulsed laser deposition on SrTiO 3(001) substrates. The standing wave was generated by kinematic Bragg diffraction. The angular dependence of the R–L and Ba–L fluorescence yield was recorded while scanning through the (005) Bragg reflection of the film. Analysis of the angular dependence leads to information on the degree of site interchange of R and Ba. We found a clear indication that Pr substitutes for Ba.
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