Abstract
We have studied the spectroscopic performance and charge transport properties of planar detectors fabricated from single crystal Cd 1− x Zn x Te ( x = 0.1 ) grown using the modified vertical Bridgman technique. For the measurement of medium energy X-rays (10–50 keV), an energy resolution of 3 keV (FWHM) was observed; however performance was seen to degrade at temperatures below 260 K. The charge transport properties of electrons were studied as a function of temperature using 241Am 5.5 MeV α-particles. At room temperature, the measured electron mobility-lifetime product ( μτ) was 1.25±0.02×10 −3 cm 2 V −1, which decreased with cooling. Evidence was found for the creation of an internal polarization field at lower temperatures consistent with the presence of deep levels with a relatively high concentration and/or capture cross-section. An analysis of the temperature dependent electron drift mobility also indicates the presence of shallow electron traps at E A∼0.2 eV.
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