Abstract
At large laser faculties, such as OMEGA and the National Ignition Facility (NIF), x-ray spectrometers are provided by the facility to diagnose plasma conditions or monitor backlighters. Often the calibration of these spectrometers is unknown or out of date. As a remedy to this situation, we present a simple ray trace method to calibrate flat crystal spectrometers using only basic information regarding the optical design of the spectrometer. This model is then used to output photometric throughput estimates, dispersion, solid angle, and spectral resolution estimates. This model is applied to the mono angle crystal spectrometer and Super Snout I at the NIF and the X-Ray Spectrometer at the OMEGA laser facility.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
