Abstract

The OSO 8 graphite crystal spectrometer was used to obtain observations, in October 1975 and January 1976, of the transient X-ray source A0620-00, which yield upper limits of no more than about 10 eV to the equivalent widths of narrow emission lines of Si XIII, Si XIV, S XV, and S XVI. Photoionization is unlikely to alter the principal conclusion that the electron scattering in the source is substantial. High-resolution spectra obtained in October 1975 reveal a featureless continuum which is better characterized as blackbody (kT about 0.5 keV) than as thin bremsstrahlung emission.

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