Abstract
In the standard approach, X-ray simulation is usually limited to the step of spatial sampling to calculate the convolution of integrals of the Fresnel type. Explicitly the sampling step is determined by the size of the last Fresnel zone in the beam aperture. In other words, the spatial sampling is determined by the precision of integral convolution calculations and is not connected with the space resolution of an optical scheme. In the developed approach the convolution in the normal space is replaced by computations of the shear strain of ambiguity function in the phase space. The spatial sampling is then determined by the space resolution of an optical scheme. The sampling step can differ in various directions because of the source anisotropy. The approach was used to simulate original images in the X-ray Talbot interferometry and showed that the simulation can be applied to optimize the methods of postprocessing.
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