Abstract
The aim of this work is to study to what extent a typical section-topography setup can supply information about the degree of coherence of the incident x-ray beam. In real experiments, the incident beam is partially coherent, with the degree of coherence described by the shape of the correlation function. In this paper the correlation functions for the outgoing beam are calculated by solving the Takagi-Taupin equations, assuming a truncated Gauss correlation function for the incident beam with the correlation length determined by the van Cittert-Zernike theorem. Its influence on the measured intensity of the diffracted beam in section topography is investigated.
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