X-ray scattering topography involving local spectroscopy

Abstract

X-ray scattering topography using multichannel detectors as a position sensitive detector and an energy dispersive solid state detector is described. The system involves measuring the X-ray spectrum at each local place. The new topography system adds another dimension to X-ray scattering topography proposed by the present authors over the past ten years. It produces topographs, constructed with certain physical quantities, such as crystal orientation, as well as an ordinary integrated intensity map. Included in the paper is the orientation topography for an Fe-3%Si alloy single crystal, structural observation of an Al-4%Cu alloy polycrystal having a welded region, and the nondestructive testing of an amorphous rubber tyre. Emphasis is placed on the first proposal of X-ray spectroscopy topography.