X-ray resonant Raman scattering cross sections of Mn, Fe, Cu and Zn

Abstract

X-ray fluorescence spectra present singular characteristics produced by the different scattering processes. When atoms are irradiated with incident energy lower and close to an absorption edge, scattering peaks appear due to an inelastic process known as resonant Raman scattering. It constitutes an important contribution to the background of the fluorescent line. The resonant Raman scattering must be taken into account in the determination of low concentration contaminants, especially when the elements have proximate atomic numbers. The values of the mass attenuation coefficients experimentally obtained when materials are analysed with monochromatic x-ray beams under resonant conditions differ from the theoretical values (between 5% and 10%). This difference is due, in part, to the resonant Raman scattering. Monochromatic synchrotron radiation was used to study the Raman effect on pure samples of Mn, Fe, Cu and Zn. Energy scans were carried out in different ranges of energy near the absorption edge of the target element. As the Raman peak has a non-symmetric shape, theoretical models for the differential cross section, convoluted with the instrument function, were used to determine the RRS cross section as a function of the incident energy.