Abstract
We present an x-ray resonant magnetic scattering study that uses the periodicity of a patterned array of trilayer (Co/Cu/NiFe) elements to determine not only layer-dependent magnetic hysteresis, but, more importantly, to extract the magnetization reversal in different sections of the picture-frame-shaped structure. Spatially resolved and layer-resolved magnetization measurements have revealed that magnetic switching mechanism is very distinct in different regions of the structure and results from a balancing of the shape anisotropy and strong interlayer dipolar coupling. These results demonstrate how spatially averaged measurements are not sufficient to resolve the nature of the reversal mechanism within the structure.
Highlights
Magnetic multilayered thin-film structures, such as spinvalve structures1 and magnetic tunnel junctions,2 are the basic elements of the next-generation magnetoelectronic devices
We present an x-ray resonant magnetic scattering study that uses the periodicity of a patterned array of trilayerCo/ Cu/ NiFeelements to determine layer-dependent magnetic hysteresis, but, more importantly, to extract the magnetization reversal in different sections of the picture-frame-shaped structure
Resolved and layer-resolved magnetization measurements have revealed that magnetic switching mechanism is very distinct in different regions of the structure and results from a balancing of the shape anisotropy and strong interlayer dipolar coupling
Summary
Magnetic multilayered thin-film structures, such as spinvalve structures1 and magnetic tunnel junctions,2 are the basic elements of the next-generation magnetoelectronic devices. Freeland,2 Yongseong Choi,3 George Srajer,2 Vitali Metlushko,4 and Bojan Ilic5
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