Abstract
The article reviews X-ray position detectors for dynamic diffraction works discussed by the author in the award talk, November 1985. After a resume of author's contributions in the development of such detectors as linear proportional counters, associated time-resolved data-collection techniques and area-detector diffractometers, the design and performances of direct- and indirect-type X-ray imaging TV detectors are discussed. Two major applications reviewed are real-time display of diffraction topographs and rapid measurement of reflection intensities from single crystals. As a recent progress the author describes a cylindrical position-sensitive streamer detector developed for powder works: this detector, covering a 2θ range of 120° with an angular resolution of 0.05°, can give high-quality powder patterns from specimens at high temperatures and is most adequate in structure refinement of inorganic compounds for electronic ceramics.
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