Abstract
Thin films of tris-(8, hydroxyquinoline) aluminum (Alq3) and N,N′-diphenyl-N,N′-bis(3-methylphenyl)-1,1′-biphenyl-4,4′-diamine (TPD) were measured using synchrotron radiation-based core and valence level photoemission and core level photoabsorption to elucidate the element-specific electronic structure of organic electroluminescent materials. The energy level alignment of an Alq3/TPD interface is given for both occupied and unoccupied states. A comparison of freshly evaporated films of Alq3 and TPD with films that have been exposed to intense radiation or oxidative conditions sheds light on possible damage mechanisms of the molecular solid.
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