Abstract
Two commonly used xanthates, potassium ethyl xanthate (KEX) and sodium isopropyl xanthate (NaiPX) were characterized by comparing their bulk and surface composition. The XPS spectra were recorded using Al Kα and Mg Kα excitation and potential sources of contamination were accounted for. Sulfate and carbonate contaminations were identified, both in the bulk and on the surface of the KEX sample. NaiPX contained hydroxyl- and carbonyl-type contaminations. The earlier published XPS spectral data on xanthates were compiled and compared with the results of this work.
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