X-ray photoelectron spectroscopy characterization of the interface between Ag electrode and PVDF film treated by electric poling

Abstract

Interface changes induced by electric poling treatment between an Ag electrode deposited by vacuum thermal evaporation and a polymer thin film have been investigated. The polymer film poly (vinylidene fluoride) (PVDF), a fluoropolymer of repeat unit (–CH2–CF2–) was treated under electric poling at high temperature of 90°C. The characterization was accomplished using X-ray photoelectron spectroscopy (XPS) as a primary tool. The results indicate that the piezoelectricity of PVDF thin films and adhesion force between polymer thin film and metallic electrode are improved by electric poling and chemical bond joint.