Abstract
Anodic oxide films on titanium and zirconium were grown in the presence of sodium tungstate. The surface and bulk characteristics of these films have been analyzed by X-ray photoelectron spectroscopy (XPS) and Rutherford backscattering spectrometry (RBS) as a function of terminal voltage and temperature. XPS results show a close association between the sodium and tungsten incorporated from the forming solution at the film surface. The RBS data reveal the existence of the tungsten species in a layered structure. These layers are distributed at regularly spaced intervals beneath the surface. The results are discussed in terms of a periodic precipitation reaction, also known as the Liesegang phenomenon.
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