Abstract
The passive layer of cathodic dichromate (CDC) and dichromate dipped (DCD) passivated tin plate was investigated by means of X-ray photoelectron spectroscopy (XPS) and electrochemical analysis.Electrochemical results were compared with atomic absorption spectroscopy and glow discharge spectroscopy data and are discussed in relation to the solid state properties of the passive layer compounds.XPS depth profiles were obtained by using a “first-principles model” for quantitative purposes and the results are evaluated on the basis of the analytical approach employed.
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