Abstract

A general theoretical framework is presented to explain the formation of the phase signal in an x-ray microscope integrated with a grating interferometer, which simultaneously enables the high spatial resolution imaging and the improved image contrast. By using this theory, several key parameters of phase contrast imaging can be predicted, for instance, the fringe visibility and period, and the conversion condition from the differential phase imaging (DPI) to the phase difference imaging (PDI). Additionally, numerical simulations are performed with certain x-ray optical components and imaging geometry. Comparison with the available experimental measurement [Appl. Phys. Lett. 113 063105 (2018)] demonstrates the accuracy of this developed quantitative analysis method of x-ray phase-sensitive microscope imaging.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.