Year-end Sale % OFF 
Abstract
Hard X-ray phase microscopy using the Speckle Tracking technique is presented and the practical implementation of this microscope explained. It is demonstrated that the spatial resolution of the Speckle Tracking technique can be pushed down to the nanometer scale without sacrificing the angular sensitivity, which is in the tens of nanoradians range. Moreover, the method is suitable for the analysis of dynamic samples. Experimental demonstration of the method is given for the case of phase imaging of micrometer size polystyrene spheres using a Fresnel zone plate as a magnifying optical element.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
