X-ray microscopy of beryllium

Abstract

The point-projection X-ray microscope has been used to study a variety of beryllium specimens, ranging from single crystals to finely-polycrystalline metal containing inclusions. The highly divergent beam of X-rays from a source 1 μ in diameter gives, on the same photograph, a microradiograph of the specimen with a resolution of 1 μ and a divergent beam diffraction pattern. Together these can give information about the distribution of heavier elements or cracks in the beryllium, the variation in perfection of the crystal lattice and, with a single crystal, the orientation and lattice parameters of the specimen.