Abstract
This paper describes an analysis which allows real composition segregation profiles to planar grain boundaries to be determined quantitatively from STEM X-ray microanalysis on thin foils. This analysis is applied to the measurement of such segregations in ironbased alloys. The influence of electron beam spreading within the foil is evaluated and an analysis is developed which allows solute composition profiles to be obtained from measured X-ray intensity profiles. The influence of various experimental parameters on the measured X-ray intensity profile are examined and discussed. The analysis procedure is applied to experimental measurements of tin segregated to prior austenite grain boundaries within the heat affected zone of a ’/2 PGt CrMoV low alloy steel weldment taken from a boiler steam chest.
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