Abstract
We obtained thin films of the Bi4Ge3O12, Bi4Si2O12, PbWO4, and Bi2WO6 scintillators and investigated their luminescence properties on x‐ray excitation. We measured the x‐ray luminescence spectra and established the linear character for the dependence of the luminescence intensity on the power of the dose of x‐ray irradiation within the limits of up to 3·10−3 A/kg. We investigated the radiation stability of the films obtained. The possibility of their application for detecting ionizing radiation is investigated. The films based on Bi4Ge3O12 with an admixture of the Ge and Si or Mn activator of up to 1.5 mol.% are most suitable.
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