Abstract
Abstract X-ray reflectivity studies on Langmuir-Blodgett multilayer films of side-chain liquid crystal polymers are reported. The films have a high degree of lamellar order. The layer periodicity is independent of the type of monolayer deposition, implying a reorientation of the side group mesogens following the deposition process. X-ray reflectivity from thin films displays subsidiary maxima permitting a quantitative measure of the change in side-chain density between multilayer and monolayer. A unit cell density profile is calculated for thick films assuming a symmetric unit cell.
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