Abstract
The bend magnet VESPERS beamline on the third generation CLS synchrotron has been equipped with capabilities for X-ray fluorescence (SXRF) excitation with micro-focussed white radiation, as well as with broad and narrow bandpass monochromatised radiation. Using the former two conditions, SXRF studies have been conducted on several reference materials and metals with known elemental concentrations. The resultant spectral line shapes have been analysed using newly developed software that facilitates ready identification of K, L and M lines present as well as their subsequent spatial mapping. Using both white and broad bandpass radiation, K lines for elements from magnesium to indium and L lines from hafnium to uranium were measured and sensitivity values (S) determined. White radiation provided much higher sensitivity for most elements, and a narrower range of S values makes it possible to use a single white radiation experiment to determine a wide range of elements in the periodic table. Additionally, the variances in S values for several low Z matrices were relatively low, thus making it possible to estimate elemental concentration ranges using a reference material.
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