Abstract
The work presents short characteristics of X-ray fluorescence method for the material element composite diagnostics in conditions of characteristic fluorescence excitation by hard X-ray beams and high energy proton beams (PIXE). There are discussed comparative data of X-ray and ion beams excitation. Specific attention is devoted to X-ray exciting beam total reflection method (TXRF) and its adaptation to the ion beam excitation by the planar X-ray waveguide-resonator application. It is shown that the modified PIXE method allows to analyze the element composition of thin surface layer and is very effective for the light element diagnostics in it.
Highlights
Specific attention is devoted to X-ray exciting beam total reflection method (TXRF) and its adaptation to the ion beam excitation by the planar X-ray waveguide-resonator application
Conventional analysis of material element composition is usually executed by use of X-ray fluorescence (XRF) method in conditions of high energy X-ray beams [1,2,3] or electron microbeams excitation [4, 5]
the exciting radiation flux (TXRF) spectrometry as well as any X-ray fluorescence analysis oriented on the fluorescence yield excitation by hard X-ray radiation, electron beams and gamma radiation shows some difficulties at the light element diagnostics in materials
Summary
Conventional analysis of material element composition is usually executed by use of X-ray fluorescence (XRF) method in conditions of high energy X-ray beams [1,2,3] or electron microbeams excitation [4, 5]. The work presents short characteristics of X-ray fluorescence method for the material element composite diagnostics in conditions of characteristic fluorescence excitation by hard X-ray beams and high energy proton beams (PIXE). 1. Introduction Conventional analysis of material element composition is usually executed by use of X-ray fluorescence (XRF) method in conditions of high energy X-ray beams [1,2,3] or electron microbeams excitation [4, 5].
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