Abstract
We demonstrate the utility of a simple, inexpensive, microchannel plate (MCP) detector for monitoring the x-ray fluorescence (XRF) yield in the soft x-ray region. The detector consists of a dual MCP array, and appropriately biased grids. We compare the Al 2p XRF yield to the total-electron yield (TEY) (obtained with the same detector) of single-crystal sapphire. These measurements show that the XRF yield has the following advantages over TEY for monitoring absorption spectra in the soft x-ray region: (1) a greater bulk sensitivity, (2) an insensitivity to charging.
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