Abstract
The residual stress left on the fracture surface is one of the important parameters in X-ray fractography. It has been used to analyze fracture mechanisms in fracture toughness and fatigue tests especially of iron and steels.In the present paper, X-ray fractography was applied to the brittle fracture surface of a silicon nitride ceramics. The first part deals with the determination of the stress constant for diffraction from Si3N4(411) plane by Cr-Kα radiation. The second part describes the effect of the notch-tip radius on the fracture toughness value. In the last part, the plastic zone depth was determined from the residual stress destribution beneath the fracture surface.
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