Abstract
We performed X-ray emission spectroscopy (XES) by using a double crystal spectrometer. Ta-Lα1 and Lα2 emission lines of Ta-related materials of Ta-metal, Ta2O5, LiTaO3, and KTaO3 were measured. XES is one of the most important spectroscopies to make a remarkable progress utilizing third generation synchrotron radiation sources. Here, we discuss some aspects of XES in Ta compounds of recent experimental data. We also discuss an azimuth dependence of partial fluorescence yield spectra (PFY) of a single-crystal KTaO3. The precise measurement by the double crystal spectrometer has revealed a change of the PFY spectrum by changing the crystal orientation, especially in the white line region.
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More From: Transactions of the Materials Research Society of Japan
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