Abstract
Minor amounts of rare earth elements (0.01 to 1.0%) in high-purity rare earth oxides may be determined by a fluorescent x-ray procedure. Basic to the method is accurate determination of spectral line intensity above background. Sample and standard preparation, choice of analytical lines, and utilization of a helium path to increase x-ray intensities are discussed. Precision and accuracy were evaluated by analyzing samples of known composition. The average of fiye separate determinations showed an average error of about 10%. (auth)
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
