Abstract
In this work, the X-ray ratio method using different thicknesses of Al foil absorbers was used to study the influence of copper impurities on the electron temperature determination of the focused plasma in AECS PF-2 with argon filling gas. Five channels of BPX 65 PIN diodes were employed to record the X-ray pulses generated by a low energy Mather type plasma focus device energized by a 25 μF, 15 kV (2.8 kJ) capacitor bank consisting of two capacitors each with 12.5 μF capacity connected in parallel. By comparing the ratio values experimentally obtained for a series of shots at various pressures with theoretically calculated ratios for argon plasma, the X-ray emission ratio was found to correspond to the Cu–Kα line radiation for most of the discharges and only about less than 10% of the measurements give the correct expected electron temperature of 1.5–2.5 keV for the focused argon plasma.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
