Abstract
X-ray diffraction, transmission electron microscopy and electron diffraction studies were conducted on CdTe thin films deposited on glass substrates kept at different substrate temperatures. Variation of the different structural parameters, such as lattice constant, crystallite size, r.m.s. strain, dislocation density and stacking fault probability with substrate temperature, was investigated in the temperature range 300 to 498 K. An increase in the lattice constant and crystallite size values and a decrease in the other parameters with increase in temperature of the substrate was observed. A photovoltage was observed for CdTe film deposited normally on glass substrates kept at higher substrate temperatures. The development of photovoltage in the film is explained in the light of the formation of crystallites of variable structure.
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