X-ray diffractometric study of polycrystalline precipitates within a single crystal matrix

Abstract

An x-ray study which reveals diffraction peaks from an additional polycrystalline phase in a single crystal matrix, is reported. The recording of these lines was possible due to the lowering of the diffractometer background through the use of a bent monochromator and Soller slits, as well as by rotating the single crystal sample out of Bragg condition. As an example of the use of the proposed experimental strategy, the results for the silicon single crystal, in which an additional phase in the form of silicon polycrystalline grains was created by ion implantation process, are presented.