Abstract
Fe79Zr10N11 films 0.7 μm thick deposited on glass substrates have been produced by rf reactive magnetron sputtering. The films are a soft magnetic material, which can exhibit a combination of a high saturation inductance and a low coercive force and, therefore, shows promise as magnetic recording cores for the high-density magnetic recording. The results of X-ray diffraction studies of the phase and structural states of the films and the effect of annealing on these states are considered.
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