X-ray diffraction studies on thin palladium films epitaxially grown on Ag(111)

Abstract

The structure of thin palladium films deposited on Ag(111) substrates at room temperature under ultrahigh vacuum conditions is characterized using a high resolution X-ray diffractometer and a texture analyser. From the angular position of the peak maxima an average lattice contraction is deduced, the extent of which still depends on film thickness. An evaluation of the side maxima appearing in the flanks of the diffraction peaks allows the quantification of surface roughness. The pole figure obtained by texture analysis reveals a transition from threefold to sixfold symmetry typical of (111)-oriented single-crystal films with built-in twinning faults.