X-Ray Diffraction Studies of Metallic Palladium-Based Foil Filters Using Synchrotron Radiation

Abstract

This paper presents the results of the study of the long-term relaxation states of metallic palladium-based foil filters (Pd, 9.6 at %; Y and Pd, 5.3 at %; In, 0.5 at %; Ru) after hydrogenation (82 000 and 58 500 h, respectively) using X-ray diffraction and synchrotron radiation (SR). We analyzed the normalized integral intensities of diffraction maxima for two orders of reflections from coherent scattering regions (CSRs) along crystallographic directions [111] and [100].