Abstract
A reciprocal-space map (ω–2θ scans) can provide more information than conventional X-ray diffraction (XRD) θ–2θ scans. In this study, an epitaxial La0.5Sr0.5CoO3 thin film prepared on the SrTiO3(100) substrate by the dipping-pyrolysis (DP) process was investigated based on XRD θ–2θ scanning, β scanning (pole figure) and asymmetric ω–2θ scanning. An epitaxial La0.5Sr0.5CoO3 film annealed at 800°C was found to consist of the pseudocubic phase with a d∥/d⊥ ratio of 1.005 by reciprocal-space map analysis.
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