X-ray diffraction from anodic TiO 2 films: in situ and ex situ comparison of the Ti (0001) face

Abstract

X-ray diffraction with synchrotron radiation is used to study the structure and epitaxy of a thin (~ 250 Å) anodic film grown slowly on the basal plane of single-crystal Ti. Anatase crystallites, roughly 130 Å in diameter, are observed, with no indication of other forms of TiO 2 or films with lower oxidation state. The oxide is more orientationally disordered than films grown on the (11 2 0) and (10 1 0) faces of Ti, but it exhibits weak six- and twelve-fold texturing by the metal sublayer. In situ and ex situ measurements are qualitatively similar, suggesting that the oxide does not change appreciably upon emersion.