Abstract
The X-ray 00l Bragg peak intensities were analyzed for multilayer Cd stearate films deposited by the Langmuir Blodgett method on glass, aluminum and SiO2 substrates. Most of the samples were found to be a mixture of regular and disordered layer structures. One sample on a SiO2 substrate was found to have a regular layer structure like a single crystal containing no disorder.
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