Abstract
We have designed and tested a 5×5 mm2 chip which includes 24 “island” Josephson tunnel junctions (STJs) with square, circular and diamond geometries, two arrays of 100 “island” junctions and other detection devices. The junctions were based on Nb-AlOx-Nb trilayers, obtained on Si substrate by a process consisting of underlayer Nb deposition, self-aligned insulation and anodization steps. The junction quality was extensively tested by measurements of the I–V characteristics down to T=1.2 K. IcRn values up to 2.16 mV have been obtained. Preliminary results concerning the response of these samples to 6 keV X-ray radiation are discussed. Effects of the substrate on the detector response have also been observed and reported. A rough estimation of the energy resolution gives about 700 eV. The quality of the junctions is such that the electronic noise is the predominant limitation to the ultimate resolution.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
