Abstract
The use of X-ray double crystal diffractometry for a nondestructive contactless determination of Rb concentration depth profile in Rb exchanged KTiOPO 4 crystals is demonstrated. Two types of layers, relaxed and strained, can be formed via the exchange process, depending on the experimental conditions. In the latter case, the exchanged layer was found to be totally strained as was determined from measurement of asymmetric X-ray reflections. The Rb and strain distribution profiles were calculated using the (0 0 8) symmetric reflection.
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