X-ray characterization of magnetic digital alloys

Abstract

Abstract Superlattices of 15 periods of (GaSb/Mn) with bilayer periods of 3 nm and 10 nm were grown on a GaAs(001) substrate by laser ablation and studied by X-ray glancing-incidence reflectometry. Both qualitative analysis and quantitative treatment of the X-ray reflection curves allow us to restore the depth profiles of the core electron density into the samples studied and to estimate the diffusion depth of Mn atoms into adjacent thicker GaSb layers, which appeared to be 3.5 nm thick.