Abstract
It is demonstrated that X-ray beam positions can be extracted from two-dimensional profiles with sub-pixel resolution. Beam-position measurements utilizing a self-designed low-cost two-dimensional detector have been performed at two synchrotron radiation beamlines of the Swiss Light Source. The effective detector pixel size was 4.8 microm and the resolution achieved for the beam position was about 5 nm. At a data rate of 25 frames per second, periodic variations of the beam position could be detected with a frequency resolution below 0.1 Hz. This allowed, for example, the influence of a turbo-pump in the X-ray optics hutch on the beam position to be quantified, and even minute variations related to the electron beam in the storage ring could be detected.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
