X-Ray Analysis of the Layer Structure in the Chiral Smectic Phase Showing V-shaped Switching

Abstract

The layer structure of the chiral smectic phase showing V-shaped switching was investigated using the X-ray diffraction method. In thin planar cells of a three-component mixture in which V-shaped switching was first reported, the chevron layer structure was confirmed. The layer structure almost kept chevron even in the application of an electric field, and additional small diffraction peaks suggesting the existence of a substructure during V-shaped switching were observed. Preliminary time-resolved results are also reported.