X-ray absorption measurements at a bending magnet beamline with an Everhart–Thornley detector: A monolayer of Ho3N@C80 on graphene

Abstract

X-ray Absorption Spectroscopy (XAS) is used for measuring monolayer quantities of Ho3N@C80 endofullerene molecules on graphene at a low flux bending magnet beamline. The total electron yield is measured with an Everhart–Thornley detector. In comparison to sample current measurements with the same noise level, our approach reduces data acquisition time and radiation dose by a factor of 25. As the first application of this setup, we report temperature-dependent measurements of the Ho M45 edge with per mille accuracy. This documents the advantages and capabilities of an Everhart–Thornely detector for XAS measurements under low x-ray flux.