Abstract

Relative intensities of X- and gamma-rays in the decays of 137Cs and 203Hg were precisely measured using a 28.27 mm 2 × 5.0 mm vertical planar HPGe detector and a 28.27 mm 2 × 5.5 mm vertical Si(Li) detector. The intensities of the X-rays measured in the decays of 137Cs and 203Hg agree reasonably well with the theoretically calculated results. The 203Hg radioisotope is recommended as an efficiency calibration source for low energy photon semiconductor detectors.

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