Writing temperature and thickness dependence of perpendicular magnetic-dot magnetization reversal probability

Abstract

Investigation is necessary to figure out magnetization dynamics at high temperatures due to the low power requirement for heat-assisted magnetic recording technology. The Landau-Lifshitz-Gilbert equation was employed to assess the dynamic of magnetization in perpendicular magnetic-dots at elevated temperatures, considering the thermal contribution to the effective field. The simulated perpendicular magnetic-dot has a 50×50 nm2 surface area with thicknesses of 10 nm, 50 nm, and 100 nm. This study reveals that the probability of magnetization reversal and the threshold field in the thermally-assisted magnetic reversal process of a magnetic dot is influenced by the thickness and writing temperature. Below the Curie point, as sample thickness increases, demagnetization energy increases, requiring a larger external magnetic field for magnetization reversal. For the thicker sample, the magnitude of the writing field decreases as the temperature increases, which corresponds to temperature-dependent magnetization. Meanwhile, the optimum writing field is obtained below the Curie point. The magnetic-dot with 100 nm of thickness has an effective writing temperature of 739.7 K with a corresponding writing field is 250 Oe while its reversal probability at zero magnetic field is up to 0.2. Magnetic-dot thickness affects magnetization reversal probability due to domain wall propagation mechanisms during magnetic switching that result from the demagnetization factor. Moreover, as the temperature approaches the Curie temperature, the probability of zero-field magnetization reversal in the absence of an external magnetic field is observed to escalate which has a direct impact on the writing field magnitude. It was found that the effective writing temperature is below the Curie temperature, which allows several hundred Oersted of the writing field.