Abstract
The dependence of the work function on Cs coverage of clean polycrystalline Be has been measured. The maximum shift obtainable is 2.3 eV. Photoemission and thick Cs overlayer measurements indicate that the minimum work function surface is at 1.6 eV. This new measurement is one of many showing that cesium covered metals and semiconductors are observed to have a minimum work function close to 1.6 eV. In general the minimum work function value is observed to be weakly dependent on the substrate. The work function is determined by the polarization of the Cs overlayer with the increase of electronic charge in the Cs-substrate interface.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
